Ultimate sensitivity with ISOCAM

被引：1
|
作者：
Altieri, B
Metcalfe, L
Blommaert, J
Elbaz, D
Starck, JL
Aussel, H
机构：
[1] ESA, Div Astrophys, VILSPA, ISO,Sci Ctr, E-28080 Madrid, Spain
[2] CEA Saclay, DSM, DAPNIA, Serv Astrophys, F-91191 Gif Sur Yvette, France
来源：
EXPERIMENTAL ASTRONOMY | 2000年 / 10卷 / 2-3期
关键词：
Data Analysis; Sensitivity Limit; Galaxy Cluster; High Redshift; Data Analysis Technique;
D O I：
10.1023/A:1008026907211
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
We discuss the instrumental factors which constrain the sensitivity limits of the midinfrared camera (ISOCAM) of ESA's Infrared Space Observatory (ISO). The observing strategy judged to be best suited to faint-source detection is described. A data analysis technique adapted to the extraction of the faintest point-sources is discussed. We report the application of these techniques to an extremely deep mid-IR observation of high redshift gravitationally lensed objects, in two filters, looking through a lensing galaxy cluster.
引用
收藏
页码：291 / 303
页数：13
相关论文
共 50 条
  • [1] Ultimate sensitivity with ISOCAM
    B. Altieri
    L. Metcalfe
    J. Blommaert
    D. Elbaz
    J.-L. Starck
    H. Aussel
    Experimental Astronomy, 2000, 10 : 291 - 303
  • [2] THE ULTIMATE SENSITIVITY OF RADIATION DETECTORS
    JONES, RC
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1947, 37 (11) : 879 - 891
  • [3] ON THE ULTIMATE SENSITIVITY IN COORDINATE MEASUREMENTS
    BRAGINSKY, VB
    GORODETSKY, ML
    ILCHENKO, VS
    VYATCHANIN, SP
    PHYSICS LETTERS A, 1993, 179 (4-5) : 244 - 248
  • [4] ULTIMATE SENSITIVITY OF HETERODYNE SPECTROMETERS
    BOUCHER, D
    BOCQUET, R
    CHEN, W
    BURIE, J
    INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES, 1993, 14 (10): : 1889 - 1903
  • [5] ULTIMATE SENSITIVITY OF MOM DETECTOR
    ASTRIK, RV
    SOONURM, TE
    KHINRIKUS, KV
    KVANTOVAYA ELEKTRONIKA, 1976, 3 (06): : 1233 - 1238
  • [6] Digital holography with ultimate sensitivity
    Gross, M.
    Atlan, M.
    OPTICS LETTERS, 2007, 32 (08) : 909 - 911
  • [7] SYSTEM - ULTIMATE PHOTOGRAPHIC SENSITIVITY
    BERG, WF
    CHIMIA, 1980, 34 (04) : 171 - 178
  • [8] ULTIMATE SURFACE SENSITIVITY .5.
    KELLEY, MJ
    CHEMTECH, 1987, 17 (05) : 294 - 299
  • [9] STRUCTURE SENSITIVITY OF ULTIMATE TENSILE STRESS
    MILMAN, YV
    MESHKOV, YY
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 9 (02): : 691 - &
  • [10] Graphene sensor achieves ultimate sensitivity
    Hadlington, Simon
    CHEMISTRY WORLD, 2007, 4 (09): : 29 - 29
12345