Electro-optic sampling of surface fields

被引：4
|
作者：
Eesley, GL [1 ]
机构：
[1] GM Corp, Ctr Res & Dev, Dept Phys & Phys Chem, Warren, MI 48090 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1997年 / 82卷 / 12期
关键词：
D O I：
10.1063/1.366477
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We demonstrate the use of time-resolved electro-optic sampling to externally monitor the dynamics of carrier heating and transport in semiconductors. This technique can be used to follow the time evolution of surface electric fields which result from the ultrafast optical generation of excess electron-hole pairs. (C) 1997 American Institute of Physics.
引用
收藏
页码：6078 / 6082
页数：5
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