Quantitative ambiguity analysis for matched-field source localization

被引:0
|
作者
Xu, W [1 ]
Baggeroer, AB [1 ]
Schmidt, H [1 ]
机构
[1] MIT, Cambridge, MA 02139 USA
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Matched-field methods find source location by matching the measured signal field with the modeled signal field The resulted ambiguity output is often characterized by a multimodal structure. At high signal-to-noise ratio (SNR), the peak at the true source position is a global maximum and can be located accurately; below some threshold SNR, the true peak is easily obscured by other ambiguous peaks, leading to an increased localization error. To analyze this threshold performance behavior, a quantitative approach for error analysis is developed in the context of the maximum likelihood estimate (MLE) and generalized to include environmental uncertainty.
引用
收藏
页码:448 / 452
页数:5
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