X-ray powder diffraction data and Rietveld refinement of CrFe3NiSn5

被引：1

作者：

Huang, JR ^{[1
]}

Zeng, LM ^{[1
]}

Sun, ZH ^{[1
]}

机构：

[1] Guangxi Univ, Inst Mat Sci, Nanning 530004, Guangxi, Peoples R China

来源：

POWDER DIFFRACTION | 2004年 / 19卷 / 04期

关键词：

CrFe3NiSn5; X-ray powder diffraction data; Rietveld refinement;

D O I：

10.1154/1.1763153

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray power diffraction data for CrFe3NiSn5 are reported. Indexing the XRD power pattern and Rietveld refinement shows that the compound crystallizes in the hexagonal crystal system, space group P6mm (No. 183) with lattice parameters a=5.3168(1) Angstrom, c=4.4261(1) Angstrom, z=0.6 and D-calc=8.011 g cm(-3). The crystal structure of CrFe3NiSn5 is of the CoSn structure type with Fe, Cr and Ni disordered in the Co position. (C) 2004 International Centre for Diffraction Data.

引用

页码：372 / 374

页数：3

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