Multistage interconnection networks reliability analysis

被引：3
|
作者：
Rajkumar, S. [1 ]
Goyal, Neeraj Kumar [1 ]
机构：
[1] IIT Kharagpur, Ctr Reliabil Engn, Kharagpur, W Bengal, India
来源：
JOURNAL OF SUPERCOMPUTING | 2016年 / 72卷 / 06期
关键词：
Multistage interconnection networks; Shuffle exchange interconnection network (SEN); Gamma interconnection networks (GIN); Reliability analysis; ARBITRARY ROTATION; GAMMA; ALGORITHM;
D O I：
10.1007/s11227-016-1734-7
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Multistage interconnection network (MIN) is an interconnection system consisting of multiple layers of interlinked switching elements arranged in a predefined topology allowing processor and memory modules to communicate with each other. Reliability evaluation for MINs is quite evident, as these measures provide user-oriented performance assessment. Reliability analysis of two important interconnection network layouts (shuffle and gamma) are computed and compared here. Reliability expressions are computed mathematically by the path set-based analytical methods using the MVI algorithm.
引用
收藏
页码：2310 / 2350
页数：41
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