X-ray Imaging of the Surface Acoustic Wave Propagation in La3Ga5SiO14 Crystal

被引：0
|
作者：
Roshchupkin, Dmitry [1 ]
Ortega, Luc [2 ]
Snigirev, Anatolii [3 ]
Snigireva, Iraida [3 ]
机构：
[1] Russian Acad Sci, Inst Microelect Technol & High Pur Mat, Chernogolovka 142432, Moscow District, Russia
[2] Univ Paris Sud, CNRS, Lab Phys Solides, UMR 8502, Orsay, France
[3] European Synchrot Radiat Fac, Grenoble, France
来源：
2013 JOINT EUROPEAN FREQUENCY AND TIME FORUM & INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM (EFTF/IFC) | 2013年
关键词：
surface acoustic waves; La3Ga5SiO14; crystal; X-ray diffraction; ssynchrotron radiation; Talbot effect; DIFFRACTION; TOPOGRAPHY;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Direct imaging of a 10 mu m surface acoustic wave (SAW) propagation in a La3Ga5SiO14 (LGS) crystal was obtained on the ESRF synchrotron radiation source in the saggital diffraction geometry using the Talbot effect. Imaging of the SAW wave field with the period 10 mu m was observed at a distance corresponding to the Talbot distance. It is shown that the presence of the growth banding in the crystal does not influence on the propagation of acoustic wave-fields in the crystal nor does it cause a distortion of the SAW wave front.
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页码：683 / +
页数：3
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