Recent research and emerging challenges in physical design for manufacturability/reliability

被引：0

作者：

Lin, Chung-Wei ^{[1
]}

Tsai, Ming-Chao ^{[2
]}

Lee, Kuang-Yao ^{[2
]}

Chen, Tai-Chen ^{[1
]}

Wang, Ting-Chi ^{[2
]}

Chang, Yao-Wen ^{[1
,3
]}

机构：

[1] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 106, Taiwan

[2] Natl Tsing Hua Univ, Dept Comp Sci, Hsinchu, Taiwan

[3] Natl Taiwan Univ, Dept Elect Engn, Taipei, Taiwan

来源：

PROCEEDINGS OF THE ASP-DAC 2007 | 2007年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

As IC process geometries scale down to the nanometer territory, the industry faces severe challenges of manufacturing limitations. To guarantee yield and reliability, physical design for manufacturability and reliability has played a pivotal role in resolution and thus yield enhancement for the imperfect manufacturing process. In this paper, we introduce major challenges arising from nanometer process technology, survey key existing techniques for handling the challenges, and provide some future research directions in physical design for manufacturability and reliability.

引用

页码：238 / +

页数：2

共 50 条

[1] Recent Research Development in Physical Design for Manufacturability
Chen, Tai-Chen
Li, Tai-Hung
Lai, Bi-Ting
Tsai, Yun-Chih
[J]. 2011 IEEE 54TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS), 2011,
[2] Recent Research and Emerging Challenges in Design and Optimization for Digital Microfluidic Biochips
Huang, Tsung-Wei
Lin, Yan-You
Chang, Jia-Wen
Ho, Tsung-Yi
[J]. 2011 IEEE INTERNATIONAL SOC CONFERENCE (SOCC), 2011, : 12 - 17
[3] Design for manufacturability: Challenges and opportunities
Sylvester, D
[J]. 2005 6TH INTERNATIONAL CONFERENCE ON ASIC PROCEEDINGS, BOOKS 1 AND 2, 2005, : 32 - 34
[4] Design for Manufacturability and Reliability in Nano Era
Debnath, Goutam
Thadikaran, Paul
[J]. 22ND INTERNATIONAL CONFERENCE ON VLSI DESIGN HELD JOINTLY WITH 8TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS, PROCEEDINGS, 2009, : 33 - 34
[5] Recent Research and Emerging Challenges in the System-Level Design of Digital Microfluidic Biochips
Pop, Paul
Maftei, Elena
Madsen, Jan
[J]. 2011 IEEE INTERNATIONAL SOC CONFERENCE (SOCC), 2011, : 6 - 11
[6] DESIGN FOR X - A NEW PUSH FOR MANUFACTURABILITY, TESTABILITY AND RELIABILITY
OHR, S
[J]. COMPUTER DESIGN, 1992, 31 (12): : 132 - &
[7] Design for manufacturability and reliability in extreme-scaling VLSI
Bei YU
Xiaoqing XU
Subhendu ROY
Yibo LIN
Jiaojiao OU
David Z.PAN
[J]. Science China(Information Sciences), 2016, 59 (06) : 96 - 118
[8] Design for manufacturability and reliability of embedded display smart card
Liu, Yang
Rodrigues, Rui
Liu, Johan
[J]. Proceedings of the Seventh IEEE CPMT Conference on High Density Microsystem Design, Packaging and Failure Analysis (HDP'05), 2005, : 476 - 478
[9] Design for manufacturability and reliability in extreme-scaling VLSI
Yu, Bei
Xu, Xiaoqing
Roy, Subhendu
Lin, Yibo
Ou, Jiaojiao
Pan, David Z.
[J]. SCIENCE CHINA-INFORMATION SCIENCES, 2016, 59 (06)
[10] Design for manufacturability and reliability in extreme-scaling VLSI
Bei Yu
Xiaoqing Xu
Subhendu Roy
Yibo Lin
Jiaojiao Ou
David Z. Pan
[J]. Science China Information Sciences, 2016, 59

← 1 2 3 4 5 →