Off-axis electron holography without Fresnel fringes

被引：17
|
作者：
Yamamoto, K
Hirayama, T
Tanji, T
机构：
[1] Japan Fine Ceram Ctr, Japan Soc Promot Sci, Nagoya, Aichi 4568587, Japan
[2] Japan Fine Ceram Ctr, Nagoya, Aichi 4568587, Japan
[3] Nagoya Univ, Dept Elect, Nagoya, Aichi 4648603, Japan
来源：
ULTRAMICROSCOPY | 2004年 / 101卷 / 2-4期
关键词：
electron holography; electron biprism; Fresnel fringes;
D O I：
10.1016/j.ultramic.2004.07.001
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
A new method for forming an electron hologram without Fresnel fringes caused by an electron biprism is presented. Adding a fine filament to the ordinary setup for off-axis electron holography directly prevented Fresnel diffraction at the electron biprism and eliminated 70% of the phase error due to the Fresnel diffraction. This made it possible to obtain a hologram having uniform interference fringes, and to reconstruct a clear phase image of a weak electric-field. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：265 / 269
页数：5
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