Conditions for a feasibility of a low-current statistical model of a complex radar target

被引:0
|
作者
Kozlov, IM [1 ]
机构
[1] Novosibirsk State Tech Univ, Novosibirsk, Russia
来源
IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA | 2004年 / 47卷 / 9-10期
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:78 / 80
页数:3
相关论文
共 50 条
  • [1] Statistical fluctuations in low-current barrier microdischarges
    Khudik, Vladimir N.
    Shvydky, Alexander A.
    Theodosiou, Constantine E.
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2007, 35 (03) : 644 - 649
  • [2] Parameters of low-point statistical models for a complex radar target
    Kozlov, IM
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA, 2003, 46 (5-6): : A51 - A56
  • [3] Prediction Model of Droplet Size in Low-current GMAW
    Xiao, Jun
    Zhang, GuangJun
    ADVANCES IN MATERIALS AND MATERIALS PROCESSING, PTS 1-3, 2013, 652-654 : 2299 - 2302
  • [4] New RCS statistical model of radar target
    Xu, Xiaojian
    Huang, Peikang
    Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 1991, 2 (01): : 60 - 66
  • [5] A New RCS Statistical Model of Radar Target
    Xu Xiaojian and Huang PeikangBeijing Institute of Environment Features
    Chinese Journal of Systems Engineering and Electronics, 1991, (01) : 60 - 66
  • [7] New statistical model for radar HRRP target recognition
    Hou, Qingyu
    Chen, Feng
    Liu, Hongwei
    Bao, Zheng
    JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS, 2010, 21 (02) : 204 - 210
  • [8] A New Statistical Model for Radar HRRP Target Recognition
    Hou, Qingyu
    Chen, Feng
    Liu, Hongwei
    Bao, Zheng
    SIXTH INTERNATIONAL SYMPOSIUM ON NEURAL NETWORKS (ISNN 2009), 2009, 56 : 401 - 409
  • [9] A REAL-TIME STATISTICAL RADAR TARGET MODEL
    SANDHU, GS
    SAYLOR, AV
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1985, 21 (04) : 490 - 507
  • [10] New statistical model for radar HRRP target recognition
    Qingyu Hou
    JournalofSystemsEngineeringandElectronics, 2010, 21 (02) : 204 - 210