Measuring one-dimensional and two-dimensional impurity density profiles on TEXTOR using combined charge exchange-beam emission spectroscopy and ultrasoft x-ray tomography

被引：7

作者：

De Bock, M

Jakubowska, K

von Hellermann, M

Jaspers, R

Donné, AJH

Shmaenok, L

机构：

[1] EURATOM, FOM Inst Plasma Phys Rijnhuizen, NL-3430 BE Nieuwegein, Netherlands

[2] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2004年 / 75卷 / 10期

关键词：

D O I：

10.1063/1.1787600

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Two techniques are presented that allow us to measure impurity density profiles in the TEXTOR tokamak plasma. The one-dimensional profiles are gathered by charge exchange recombination spectroscopy (CXRS) in combination with beam emission spectroscopy (BES). Combining CXRS and BES eliminate the need for absolute calibration. For two-dimensional profiles an ultrasoft x-ray tomography system has been developed. The system is spectrally resolved and produces local emissivity profiles of several ionization stages of impurities. Both systems are presently being commissioned. They are complementary and give an insight into the impurity distribution and transport in plasmas. (C) 2004 American Institute of Physics.

引用

页码：4155 / 4157

页数：3

共 31 条

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