MBE-growth of novel MnF2-CaF2 superlattices on Si(111) and their characterization

被引:5
|
作者
Sokolov, NS
Takeda, Y
Banshchikov, AG
Harada, J
Inaba, K
Ofuchi, H
Tabuchi, M
Yakovlev, NL
机构
[1] Russian Acad Sci, AF Ioffe Physicotech Inst, Solid State Opt Dept, St Petersburg 194021, Russia
[2] Nagoya Univ, Grad Sch Engn, Dept Mat Sci & Engn, Nagoya, Aichi 4648603, Japan
[3] Rigaku Corp, Tokyo 1960003, Japan
基金
俄罗斯基础研究基金会; 日本学术振兴会;
关键词
molecular beam epitaxy; MnF2-CaF2; superlattices; structural characterization; metastable phase;
D O I
10.1016/S0169-4332(00)00235-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Novel short-period MnF2-CaF2 superlattices (SLs) on Si(111) substrates have been grown by molecular beam epitaxy. The thickness of a MnF2 layer was 1-3 molecular layers. Reflection high-energy electron diffraction studies indicated the fluorite type of crystal structure of these layers. Fluorescent extended X-ray absorption fine structure measurements supported this observation. Atomic force microscopy measurements showed a flat surface morphology of the SLs. X-ray diffraction measurements revealed well-pronounced superstructural reflections. The width of their omega-curve did not exceed 2.5 are min, which indicated a good crystal quality of the SLs. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:469 / 473
页数:5
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