Stable contrast mode on TiO2 (110) surface with metal-coated tips using AFM

被引：12

作者：

Li, Yan Jun ^{[1
,2
]}

Wen, Huanfei ^{[1
]}

Zhang, Quanzhen ^{[1
]}

Adachi, Yuuki ^{[1
]}

Arima, Eiji ^{[1
]}

Kinoshita, Yukinori ^{[3
]}

Nomura, Hikaru ^{[4
]}

Ma, Zongmin ^{[1
,2
]}

Kou, Lili ^{[1
]}

Tsukuda, Yoshihiro ^{[1
]}

Naitoh, Yoshitaka ^{[1
]}

Sugawara, Yasuhiro ^{[1
]}

Xu, Rui ^{[5
]}

Cheng, Zhihai ^{[5
]}

机构：

[1] Osaka Univ, Dept Appl Phys, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan

[2] North Univ China, Natl Key Lab Elect Measurement & Technol, 3 Xueyuan Rd, Taiyuan 030051, Shanxi, Peoples R China

[3] Akita Univ, Grad Sch Engn & Resource Sci, Res Ctr Engn Sci, 1-1 Gakuencho, Tegata, Akita 0108502, Japan

[4] Osaka Univ, Grad Sch Engn, Mat & Mfg Sci, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan

[5] Natl Ctr Nanosci & Technol, CAS Ctr Excellence Nanosci, CAS Key Lab Standardizat & Measurement Nanotechno, Beijing 100190, Peoples R China

来源：

ULTRAMICROSCOPY | 2018年 / 191卷

基金：

日本学术振兴会;

关键词：

TiO2 (110) surface; Stable contrast mode; Atomic force microscopy (AFM); WORK FUNCTION; FORCE; MICROSCOPY; DEFECTS;

D O I：

10.1016/j.ultramic.2018.04.003

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We investigated a method to obtain a stable contrast mode on the TiO2 (110) surface. The stable contrast rate is approximately 95% with a W-coated Si cantilever, which demonstrates that a stable tip apex plays an important role to obtain the real geometry of the surface during atomic force microscopy measurement. Information related to surface structure and tunnelling current on the TiO2 (110) surface can be obtained by the W-coated Si cantilever. It is possible to investigate the electronic structure and surface potential on the TiO2 (110) surface with atomic resolution. In particular, the proposed method could be widely applied to investigate the catalytic activity and the mechanism of a catalytic reaction by a metal-coated tip in the future. (C) 2018 Elsevier B.V. All rights reserved.

引用

页码：51 / 55

页数：5

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