Strong Crystallographic Influence on Spin Hall Mechanism in PLD-Grown IrO2 Thin Films

被引:3
|
作者
Jimenez-Cavero, Pilar [1 ,2 ]
Lucas, Irene [1 ,2 ]
Ara-Arteaga, Jorge [2 ]
Ibarra, M. Ricardo [1 ,2 ,3 ]
Algarabel, Pedro A. [1 ,2 ]
Morellon, Luis [1 ,2 ]
机构
[1] Univ Zaragoza, Inst Nanociencia & Mat Aragon, CSIC, Zaragoza 50018, Spain
[2] Univ Zaragoza, Dept Fis Mat Condensada, Zaragoza 50009, Spain
[3] Univ Zaragoza, Lab Microscopias Avanzadas, Zaragoza 50018, Spain
基金
奥地利科学基金会;
关键词
spin Hall effect; spin Seebeck effect; spin-to-charge conversion; iridium oxide; SIDE-JUMP MECHANISM; ELECTRONIC-STRUCTURE; RUTILE; RUO2; OXIDES;
D O I
10.3390/nano11061478
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Spin-to-charge conversion is a central process in the emerging field of spintronics. One of its main applications is the electrical detection of spin currents, and for this, the inverse spin Hall effect (ISHE) has become one of the preferred methods. We studied the thickness dependence of the ISHE in iridium oxide (IrO2) thin films, producing spin currents by means of the spin Seebeck effect in gamma-Fe2O3/IrO2 bilayers prepared by pulsed laser deposition (PLD). The observed ISHE charge current density, which features a maximum as a consequence of the spin diffusion length scale, follows the typical behaviour of spin-Hall-related phenomena. By fitting to the theory developed by Castel et al., we find that the spin Hall angle theta(SH) scales proportionally to the thin film resistivity, theta(SH) proportional to rho(c), and obtains a value for the spin diffusion length lambda(IrO2) of lambda(IrO2) = 3.3(7) nm. In addition, we observe a negative theta(SH) for every studied thickness and temperature, unlike previously reported works, which brings the possibility of tuning the desired functionality of high-resistance spin-Hall-based devices. We attribute this behaviour to the textured growth of the sample in the context of a highly anisotropic value of the spin Hall conductivity in this material.
引用
收藏
页数:10
相关论文
共 50 条
  • [1] Crystallographic Spin Torque Conductivity Tensor of Epitaxial IrO2 Thin Films for Oxide Spintronics
    Patton, Michael
    Pharis, Daniel A.
    Gurung, Gautam
    Huang, Xiaoxi
    Noh, Gahee
    Tsymbal, Evgeny Y.
    Choi, Si-Young
    Ralph, Daniel C.
    Rzchowski, Mark S.
    Eom, Chang-Beom
    ADVANCED MATERIALS, 2025, 37 (09)
  • [2] The influence of deposition parameters on the structural quality of PLD-grown GaN/sapphire thin films
    Kawwam, M.
    Lebbou, K.
    APPLIED SURFACE SCIENCE, 2014, 292 : 906 - 914
  • [3] The influence of deposition parameters on the structural quality of PLD-grown GaN/sapphire thin films
    Kawwam, M. (mohammad.kawwam@univ-lyon1.fr), 1600, Elsevier B.V., Netherlands (292):
  • [4] Role of Dirac nodal lines and strain on the high spin Hall conductivity of epitaxial IrO2 thin films
    Bose, Arnab
    Nelson, Jocienne N.
    Zhang, Xiyue S.
    Jain, Rakshit
    Schlom, D.G.
    Ralph, D.C.
    Muller, D.A.
    Shen, K.M.
    Buhrman, R.A.
    arXiv, 2020,
  • [5] Microstructure analysis of IrO2 thin films
    Hou, Xiuyi
    Takahashi, Ryota
    Yamamoto, Takahisa
    Lippmaa, Mikk
    JOURNAL OF CRYSTAL GROWTH, 2017, 462 : 24 - 28
  • [6] Photochromic response of the PLD-grown nanostructured MoO3 thin films
    Dixit, Divya
    Ramachandran, B.
    Chitra, M.
    Madhuri, K., V
    Mangamma, G.
    APPLIED SURFACE SCIENCE, 2021, 553
  • [7] Preparation and properties of IrO2 thin films grown by pulsed laser deposition technique
    Gong Yansheng
    Wang Chuanbin
    Qiang, Shen
    Zhang Lianmeng
    JOURNAL OF WUHAN UNIVERSITY OF TECHNOLOGY-MATERIALS SCIENCE EDITION, 2007, 22 (01): : 77 - 81
  • [8] Preparation and properties of IrO2 thin films grown by pulsed laser deposition technique
    Yansheng Gong
    Chuanbin Wang
    Qiang Shen
    Lianmeng Zhang
    Journal of Wuhan University of Technology-Mater. Sci. Ed., 2007, 22 : 77 - 81
  • [9] Electrical transport and morphological study of PLD-grown nanostructured amorphous carbon thin films
    Kant, K. Mohan
    Reddy, N. Mahipal
    Rama, N.
    Sethupathi, K.
    Rao, M. S. Ramachandra
    NANOTECHNOLOGY, 2006, 17 (20) : 5244 - 5247
  • [10] Characterization of IrO2 thin films by Raman spectroscopy
    Liao, PC
    Chen, CS
    Ho, WS
    Huang, YS
    Tiong, KK
    THIN SOLID FILMS, 1997, 301 (1-2) : 7 - 11