Automatic device for testing thermal resistance with thermoelectric effect

被引：0
|
作者：
Vasiliev, I. M. [1 ]
Soldatov, A., I [1 ,2 ]
Dementiev, A. A. [1 ]
Soldatov, A. A. [1 ,2 ]
Abouellaill, A. [1 ]
机构：
[1] Natl Res Tomsk Polytech Univ, Tomsk, Russia
[2] Tomsk State Univ Control Syst & Radioelect, Tomsk, Russia
来源：
INTERNATIONAL CONFERENCE ACTUAL TRENDS IN RADIOPHYSICS | 2020年 / 1499卷
关键词：
D O I：
10.1088/1742-6596/1499/1/012047
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
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页数：6
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