Twin support vector machines for pattern classification

被引:1099
|
作者
Jayadeva
Khemchandani, R.
Chandra, Suresh
机构
[1] Indian Inst Technol, Dept Elect Engn, New Delhi 110016, India
[2] Indian Inst Technol, Dept Math, New Delhi 110016, India
关键词
support vector machines; pattern classification; machine learning; generalized eigenvalues; eigenvalues; eigenvectors;
D O I
10.1109/TPAMI.2007.1068
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
We propose Twin SVM, a binary SVM classifier that determines two nonparallel planes by solving two related SVM-type problems, each of which is smaller than in a conventional SVM. The Twin SVM formulation is in the spirit of proximal SVMs via generalized eigenvalues. On several benchmark data sets, Twin SVM is not only fast, but shows good generalization. Twin SVM is also useful for automatically discovering two-dimensional projections of the data.
引用
收藏
页码:905 / 910
页数:6
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