Field and temperature-dependent thin film characterization with a continuous-wave terahertz magneto-spectrometer

被引：0
|
作者：
Daughton, D. R. [1 ]
Higgins, R. [1 ]
Yano, S. [1 ]
机构：
[1] Lake Shore Cryotron, Westerville, OH 43082 USA
来源：
2014 39TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ) | 2014年
关键词：
D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report on a non-contact, non-destructive evaluation system which utilizes frequency-domain THz transmission spectroscopy to examine the temperature and magnetic field-dependent conductivity of thin film on substrate materials.
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页数：2
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