Investigating the probe-tip influence on imaging using scanning near-field optical microscopy

被引：5

作者：

Achmari, Panji ^{[1
,2
]}

Siddiquee, Arif M. ^{[1
,2
,3
]}

Si, Guangyuan ^{[4
]}

Lin, Jiao ^{[5
]}

Abbey, Brian ^{[1
,2
]}

Kou, Shanshan ^{[1
,2
]}

机构：

[1] La Trobe Univ, La Trobe Inst Mol Sci LIMS, Dept Chem & Phys, Bundoora, Vic 3086, Australia

[2] La Trobe Univ, Ctr Excellence Adv Mol Imaging, Bundoora, Vic 3086, Australia

[3] Xiamen Univ, Dept Elect Sci, Xiamen 361005, Peoples R China

[4] Melbourne Ctr Nanofabricat, Victorian Node Australian Natl Fabricat Facil, Melbourne, Vic 3168, Australia

[5] RMIT Univ, Sch Engn, Melbourne, Vic 3000, Australia

来源：

OSA CONTINUUM | 2021年 / 4卷 / 04期

关键词：

DIFFERENCE TIME-DOMAIN; SURFACE-PLASMON; SLIT APERTURES; SNOM; TRANSMISSION; FLUORESCENCE; RESOLUTION; ARTIFACTS; LIGHT;

D O I：

10.1364/OSAC.415810

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The influence of the near-field probe-tip on a model sample consisting of onedimensional apertures is investigated using scanning near-field optical microscopy (SNOM). We use finite-difference time-domain (FDTD) simulations combined with SNOM scans to show that the probe-tip has a rather profound effect on the shape of the measured transmission intensity profiles. By taking into account the near-field perturbations introduced by the probe, our newly developed FDTD model facilitates the quantitative analysis of SNOM data and provides new insights into near-surface, subwavelength optical interactions. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

引用

页码：1143 / 1154

页数：12

共 50 条

[1] Raman microscopy using a scanning near-field optical probe
Webster, S
Smith, DA
Batchelder, DN
[J]. VIBRATIONAL SPECTROSCOPY, 1998, 18 (01) : 51 - 59
[2] Influence of probe tip size and incident light polarization on resolution in near-field scanning optical microscopy
Wang, GY
Wu, QH
Xu, ZZ
[J]. NANOPHOTONICS, NANOSTRUCTURE, AND NANOMETROLOGY, 2005, 5635 : 18 - 30
[3] A simple model of the scanning near-field optical microscopy probe tip for electric field enhancement
Wang, Yingjie
Cai, Wei
Yang, Mu
Liu, Zhengliang
Shang, Guangyi
[J]. OPTICA APPLICATA, 2017, 47 (01) : 119 - 130
[4] Influence of tip modulation on image formation in scanning near-field optical microscopy
Walford, JN
Porto, JA
Carminati, R
Greffet, JJ
Adam, PM
Hudlet, S
Bijeon, JL
Stashkevich, A
Royer, P
[J]. JOURNAL OF APPLIED PHYSICS, 2001, 89 (09) : 5159 - 5169
[5] Near-field scanning optical microscopy with an active probe
Gan, QQ
Song, GF
Yang, GH
Xu, Y
Gao, JX
Li, YZ
Cao, Q
Chen, LH
Lu, HW
Chen, ZH
Zeng, W
Yan, RJ
[J]. APPLIED PHYSICS LETTERS, 2006, 88 (12)
[6] OPTICAL NEAR-FIELD IMAGING WITH A SEMICONDUCTOR PROBE TIP
MERTZ, J
HIPP, M
MLYNEK, J
MARTI, O
[J]. APPLIED PHYSICS LETTERS, 1994, 64 (18) : 2338 - 2340
[7] Impacts of probe-tip tilt on scanning probe microscopy
Mizuno, F
Misumi, I
Gonda, S
Kurosawa, T
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (06): : 3394 - 3398
[8] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A METALLIC PROBE TIP
INOUYE, Y
KAWATA, S
[J]. OPTICS LETTERS, 1994, 19 (03) : 159 - 161
[9] Near-field scanning optical microscopy with monolithic silicon light emitting diode on probe tip
Hoshino, Kazunori
Rozanski, Lynn J.
Bout, David A. Vanden
Zhang, Xiaojing
[J]. APPLIED PHYSICS LETTERS, 2008, 92 (13)
[10] Enhancing the resolution of scanning near-field optical microscopy by a metal tip grown on an aperture probe
Frey, HG
Keilmann, F
Kriele, A
Guckenberger, R
[J]. APPLIED PHYSICS LETTERS, 2002, 81 (26) : 5030 - 5032

← 1 2 3 4 5 →