Simultaneous phase-shifting dual-wavelength interferometry based on two-step demodulation algorithm

被引：50
|
作者：
Zhang, Wangping [1 ]
Lu, Xiaoxu [1 ]
Fei, Leihuan [1 ]
Zhao, Hui [1 ]
Wang, Hanling [1 ]
Zhong, Liyun [1 ]
机构：
[1] S China Normal Univ, Lab Nanophoton Funct Mat & Devices, Guangzhou 510006, Guangdong, Peoples R China
来源：
OPTICS LETTERS | 2014年 / 39卷 / 18期
基金：
中国国家自然科学基金;
关键词：
MULTIWAVELENGTH DIGITAL HOLOGRAPHY; 2-WAVELENGTH INTERFEROMETRY; CHROMATIC ABERRATIONS; POLARIZING SEPARATION; MICROSCOPY; TRANSFORM;
D O I：
10.1364/OL.39.005375
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A simultaneous phase-shifting dual-wavelength interferometry based on two-step demodulation algorithm is proposed in this Letter. First, two lasers with different wavelengths go through the same inline phase-shifting interference system simultaneously, and a sequence of five frames of simultaneous phase-shifting dual-wavelength interferograms (SPSDWIs) with the special phase shifts are captured by a monochrome CCD. Subsequently, using the subtraction between the first SPSDWI and the other SPSDWI, each wavelength of two frames of single-wavelength interference images (SWIIs) without the background can be achieved. Finally, using two-step demodulation algorithm, the wrapped phase of each single-wavelength can be determined easily and quickly with high accuracy. (C) 2014 Optical Society of America
引用
收藏
页码：5375 / 5378
页数：4
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