Role of surface tension in copper electroplating

被引:10
|
作者
Chang, Shih-Chieh
Wang, Ying-Lang [1 ]
Hung, Chi-Cheng
Lee, Wen-His
Hwang, Gwo-Jen
机构
[1] Natl Univ Tainan, Dept Mat Sci, Tainan, Taiwan
[2] Natl Chiayi Univ, Dept Appl Phys, Chiayi, Taiwan
[3] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 70101, Taiwan
[4] Natl Univ Tainan, Coll Sci & Engn, Tainan, Taiwan
来源
关键词
D O I
10.1116/1.2731354
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This study demonstrates that the surface tension of plating solutions should be optimized to achieve a compromise between the gap-filling capability of copper electroplating and the formation of copper-void defects. The plating solution with lower surface tension has better gap filling but generates more air bubbles during copper electroplating. For a low-surface-tension electrolyte, the improvement in the gap-filling capability is caused by the enhancement in the ability of fluids to wet high-aspect-ratio features, whereas the increase in the formation of copper-void defects results from more air bubbles generated during the electroplating process. This study provides a model to describe the role of surface tension in copper electroplating. (C) 2007 American Vacuum Society.
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页码:566 / 569
页数:4
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