Study of Deep-hole Aperture Measurement Management System Based on Capacitance Sensor

被引:0
|
作者
Yu Yong-Xin [1 ]
Zhang Heng
Chang Yi-Zhe [1 ]
Wang Zong-Chao
Wang Bao-guang
机构
[1] Tianjin Univ, Sch Comp Sci & Technol, Tianjin 300072, Peoples R China
关键词
LabVIEW; deep-hole measurement; non-contact capacitance sensor; database operation; CCD camera; precise positioning;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In modern measurement, computer is the core of instruments control, data acquisition, data processing, data storage and information exchanging. Thus, developing a multi-function PC-based management system is critical for modern instruments. In this article, we provide a measurement management system, which is developed by NI Lab VIEW, for deep-hole aperture measuring in high precision. The measurement is realized by capacitance sensors, which offer non-contact inspection. In this measurement system, a stepper motor is controlled to drive sensor going to different depths, a USB data acquisition card is operated and the measuring result can be displayed on computer during the measurement. A CCD camera is adopted to precisely position the capacitance sensor in the center of hole. Besides, a relational database developed by Microsoft Access is applied, so that all the information about the gauges and workpiece (demarcating information, measuring detail, and so on) can be stored and queried conveniently. The ODBC technology is used to make the operation of database possible.
引用
收藏
页码:1807 / 1811
页数:5
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