On the Possibility of Two-Dimensional Focusing of Reflected X-Rays from Quartz Single Crystal in the Presence of External Temperature Gradient

The Laue reflection from a quartz single crystal was experimentally studied in the presence of temperature gradient applied perpendicularly to reflecting atomic planes (10 (1) over bar1), so that a two-dimensional bending of these planes occurs. It is shown that as a result of such an application of temperature gradient to a crystal, the two-dimensional focusing of reflected X-rays is obtained. With increasing temperature gradient the focus of X-rays approaches the crystal more rapidly in the plane of reflection than in the perpendicular one.