共 37 条
- [1] Investigation of charge transport in thin, doped sexithiophene crystals by conducting probe atomic force microscopy [J]. JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (10): : 1679 - 1688
- [2] Measurement of charge transport through self-assembled monolayers of organothiols by conducting probe atomic force microscopy [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2005, 230 : U1121 - U1121
- [4] Investigation of intrinsic charge transport via alkyl thiol molecular electronic junctions with conductive probe atomic force microscopy [J]. Journal of Materials Science: Materials in Electronics, 2022, 33 : 13568 - 13573
- [6] Charge Transport in Metal-Molecule-Metal Junctions Probed by Conducting Atomic Force Microscopy [J]. BULLETIN OF THE KOREAN CHEMICAL SOCIETY, 2013, 34 (07): : 1959 - 1960
- [7] Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals [J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2018, 9 : 1695 - 1704
- [8] Conducting probe atomic force microscopy study of electrical and mechanical properties of single ferritin nanoparticles [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2009, 237
- [9] ATOMIC-FORCE MICROSCOPY OF SOLUTION-GROWN POLYETHYLENE SINGLE-CRYSTALS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (6B): : 3771 - 3774
- [10] Conducting probe atomic force microscopy of 2-14 nm thick organic molecular crystals. [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 216 : U186 - U187