Three-dimensional analysis for functionally graded piezoelectric semiconductors

被引:14
|
作者
Lu, Hubert Hsueh-Hsien [1 ]
Young, D. L. [1 ]
Sladek, Jan [2 ]
Sladek, Vladimir [2 ]
机构
[1] Natl Taiwan Univ, Dept Civil Engn, 1,Sec 4,Roosevelt Rd, Taipei 10617, Taiwan
[2] Slovak Acad Sci, Inst Construct & Architecture, Bratislava, Slovakia
关键词
Local radial basis function collocation method; functionally graded materials; piezoelectric semiconductors; Houbolt finite-difference method; INTEGRAL-EQUATION FORMULATION; FUNCTION COLLOCATION METHOD; DATA APPROXIMATION SCHEME; DYNAMIC CRACK ANALYSIS; FUNDAMENTAL-SOLUTIONS; MESHLESS ANALYSIS; ELASTIC ANALYSIS; FINITE-ELEMENT; PLATES; SOLIDS;
D O I
10.1177/1045389X16672566
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article presents numerical analyses of functionally graded piezoelectric beam with piezoelectric semiconducting material properties using meshless method. Unlike piezoelectric dielectric materials, electron density and electric current are additionally considered in constitutive equations for piezoelectric semiconductors. Mutual coupling of elastic displacements, electric potentials, and electron density increases the complexity of the analyzed problem. For the solution of the set of partial differential equations with non-constant coefficients, the local radial basis function collocation method is proposed in this work. Approximating the spatial variations of all physical fields in the partial differential equations by the multiquadric radial basis function entails an ensuing system for time-dependent problems solved by the Houbolt finite-difference scheme as a time-stepping method. The presented local radial basis function collocation method is verified using the corresponding results obtained using the finite element method. The influence of material parameter gradation and initial electron density is then investigated, along with transient analyses.
引用
收藏
页码:1391 / 1406
页数:16
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