Growth of copper and palladium on α-Al2O3(0001)

被引:47
|
作者
Pang, CL
Raza, H
Haycock, SA
Thornton, G [1 ]
机构
[1] Univ Manchester, Surface Sci Res Ctr, Manchester M13 9PL, Lancs, England
[2] Univ Manchester, Dept Chem, Manchester M13 9PL, Lancs, England
基金
英国工程与自然科学研究理事会;
关键词
aluminium oxide; atomic force microscopy; copper; growth; low index single crystal surface; palladium;
D O I
10.1016/S0039-6028(00)00594-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Non-contact atomic force microscopy (NC-AFM) has been used to image the room-temperature growth of copper and palladium on the (1 x 1) and (root 31 x root 31) R +/- 9 degrees terminations of alpha-Al2O3(0001). Three-dimensional (3D) clusters of palladium are observed on both the (1 x 1) and the (root 31 x root 31) R +/- 9 degrees terminations, with 3D clusters of copper observed on the reconstructed surface. There is evidence of step-edge-dominated growth of palladium on the (root 31 x root 31) R +/- 9 degrees termination. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:L510 / L514
页数:5
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