Based on recent discoveries, we introduce a method to project a single structured pattern onto an object and then reconstruct the three-dimensional range from the distortions in the reflected and captured image. Traditional structured light methods require several different patterns to recover the depth, without ambiguity or albedo sensitivity, and are corrupted by object movement during the projection/capture process. Our method efficiently combines multiple patterns into a single composite pattern projection allowing for real-time implementations. Because structured light techniques require standard image capture and projection technology, unlike time of arrival techniques, they are relatively low cost. (C) 2003 Optical Society of America
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Univ Illinois, Dept Civil & Mat Engn, 842 W Taylor St, Chicago, IL 60607 USAUniv Illinois, Dept Civil & Mat Engn, 842 W Taylor St, Chicago, IL 60607 USA
Klein, John T.
Karpov, Eduard G.
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Univ Illinois, Dept Civil & Mat Engn, 842 W Taylor St, Chicago, IL 60607 USAUniv Illinois, Dept Civil & Mat Engn, 842 W Taylor St, Chicago, IL 60607 USA
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Univ Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, CanadaUniv Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
Dorrah, Ahmed H.
Rosales-Guzman, Carmelo
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Univ Witwatersrand, Sch Phys, Private Bag 3, ZA-2050 Johannesburg, South AfricaUniv Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
Rosales-Guzman, Carmelo
Forbes, Andrew
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Univ Witwatersrand, Sch Phys, Private Bag 3, ZA-2050 Johannesburg, South AfricaUniv Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
Forbes, Andrew
Mojahedi, Mo
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Univ Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, CanadaUniv Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada