A 0.75-3.0-Gb/s Dual-Mode Temperature-Tolerant Referenceless CDR With a Deadzone-Compensated Frequency Detector

被引:18
|
作者
Jin, Jahoon [1 ]
Jin, Xuefan [1 ]
Jung, Jaehong [1 ,2 ]
Kwon, Kiwon [1 ,2 ]
Kim, Jintae [3 ]
Chun, Jung-Hoon [1 ]
机构
[1] Sungkyunkwan Univ, Coll Informat & Commun Engn, Suwon 16419, South Korea
[2] Samsung Elect, Hwaseong 18448, South Korea
[3] Konkuk Univ, Dept Elect Engn, Seoul 05029, South Korea
关键词
Clock and data recovery (CDR); deadzone compensation; dual-mode; frequency acquisition; jitter tolerance (JTOL); referenceless; temperature compensation; DATA RECOVERY CIRCUIT; ADAPTIVE EQUALIZATION; SUBTHRESHOLD MOSFETS; CMOS; ACQUISITION; CLOCK; TRANSCEIVER; PHASE; PLL;
D O I
10.1109/JSSC.2018.2856243
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a 750-Mb/s to 3.0-Gb/s dual-mode (full and half rate) referenceless clock and data recovery (CDR) circuit in a 65-nm CMOS process. The dual-mode deadzone-compensated frequency detector (DC-FD) and the digital calibration of both bank and control voltage of voltage-controlled oscillators (VCOs) allow precise frequency acquisition even with high input jitter. The dual-mode scheme extends supported data rates, and the temperature compensation technique allows uninterrupted video transmission with a bit error rate (BER) below 10(-)(12) over a wide temperature range from -20 degrees C to 120 degrees C.
引用
收藏
页码:2994 / 3003
页数:10
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