Key-length analysis of double random phase encoding (vol 56, pg 4474, 2017)

被引：0
|
作者：
Nakano, Kazuya [1 ]
Takeda, Masafumi [2 ]
Suzuki, Hiroyuki [3 ]
机构：
[1] Tokyo Univ Sci, Fac Sci, Div 2, Shinjiku Ku, 1-3 Kagurazaka, Tokyo, Japan
[2] SanDisk Ltd, 800 Yamanoisshiki Cho, Yokaichi, Mie, Japan
[3] Tokyo Inst Technol, Inst Innovat Res, Lab Future Interdisciplinary Res Sci & Technol, Midori Ku, 4259 Nagatsutacho, Yokohama, Kanagawa, Japan
来源：
APPLIED OPTICS | 2017年 / 56卷 / 17期
关键词：
D O I：
10.1364/AO.56.004917
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This publisher's note corrects a value in Table 3 in [Appl. Opt.56, 4474 (2017)APOPAI0003-693510.1364/AO.56.004474].
引用
收藏
页码：4917 / 4917
页数：1
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