PSU for a scanning electron microscope

被引：0

作者：

Revell, P

May, R

机构：

来源：

ELECTRONIC ENGINEERING | 1998年 / 70卷 / 855期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：56 / 57

页数：2

共 50 条

[1] The Scanning Electron Microscope
von Ardenne, Manfred
[J]. ZEITSCHRIFT FUR PHYSIK, 1938, 109 (9-10): : 553 - 572
[2] SCANNING ELECTRON MICROSCOPE
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[J]. JOURNAL OF APPLIED PHYSICS, 1957, 28 (11) : 1368 - 1368
[3] SCANNING ELECTRON MICROSCOPE
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[J]. IEEE SPECTRUM, 1967, 4 (10) : 96 - &
[4] SCANNING ELECTRON MICROSCOPE
OATLEY, CW
[J]. SCIENCE PROGRESS, 1966, 54 (216) : 483 - &
[5] SCANNING ELECTRON MICROSCOPE
LANGFORD, MJ
[J]. INDUSTRIAL PHOTOGRAPHY, 1968, 17 (04): : 6 - +
[6] SCANNING ELECTRON MICROSCOPE
不详
[J]. AGRICULTURAL RESEARCH, 1970, 19 (06) : 8 - &
[7] SCANNING ELECTRON MICROSCOPE
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QUILLIAM, TA
[J]. MEDICAL AND BIOLOGICAL ILLUSTRATION, 1966, 16 (02): : 116 - &
[8] SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE
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[J]. ULTRAMICROSCOPY, 1987, 23 (01) : 115 - 118
[9] THE COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
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GARCIA, R
[J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 283 - 283
[10] COMBINATION OF A SCANNING TUNNELING MICROSCOPE WITH A SCANNING ELECTRON-MICROSCOPE
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BARTOLOME, A
GARCIA, R
BUENDIA, A
BARO, AM
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1286 - 1289