Refinement of conditions of point-contact current imaging atomic force microscopy for molecular-scale conduction measurements

被引：15
|
作者：
Yajima, Takashi
Tanaka, Hirofumi
Matsumoto, Takuya
Otsuka, Yoichi
Sugawara, Yoshitaka
Ogawa, Takuji
机构：
[1] Inst Mol Sci, Res Ctr Mol Scale Nanosci, Okazaki, Aichi 4448787, Japan
[2] Grad Univ Adv Study Sokendai, Okazaki, Aichi 4448787, Japan
[3] JST, CREST, Kawaguchi, Saitama 3320012, Japan
[4] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan
来源：
NANOTECHNOLOGY | 2007年 / 18卷 / 09期
关键词：
D O I：
10.1088/0957-4484/18/9/095501
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We have refined the measurement conditions of point-contact current imaging microscopy (PCI-AFM) to measure the electric properties along the long axes of one-dimensional structures. Using this refinement, the current image of the PCI-AFM can be used to distinguish individual single-walled carbon nanotubes in a bundled structure. The PCI-AFM will thus help further developments in nanoscience for conduction measurements in one-dimensional structures.
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页数：5
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