Degradation of self-assembled monolayers in organic photovoltaic devices

被引：7
|
作者：
Angel, Felipe A. [1 ]
Lyubarskaya, Yekaterina L. [1 ]
Shestopalov, Alexander A. [2 ]
Tang, Ching W. [1 ,2 ]
机构：
[1] Univ Rochester, Dept Chem, Rochester, NY 14627 USA
[2] Univ Rochester, Dept Chem Engn, Rochester, NY 14627 USA
来源：
ORGANIC ELECTRONICS | 2014年 / 15卷 / 12期
基金：
美国国家科学基金会;
关键词：
Phosphonic acid self-assembled monolayers; Organic photovoltaic devices; SAM stability; Device lifetime; INDIUM TIN OXIDE; SURFACE MODIFICATION; PHOSPHONIC-ACIDS; CELLS; ADSORPTION; BINDING;
D O I：
10.1016/j.orgel.2014.10.004
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Self-assembled monolayers (SAMs) based on n-octylphosphonic acid (C8PA) and 1H,1H,2H,2H-perfluorooctanephosphonic acid (PFOPA) were investigated for application as an anode buffer layer in C-60-based organic photovoltaic (OPV) devices. We found that the degradation of the OPV efficiency with respect to air exposure was significantly reduced with the perfluorinated PFOPA compared to the aliphatic C8PA. We attribute the OPV degradation to moisture diffusion from the top aluminum electrode and the lowering of the anode work function as a result of hydrolysis of the SAM buffer layer. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码：3624 / 3631
页数：8
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