Exploration of crystal strains using coherent x-ray diffraction

We measured coherent x-ray diffraction (CXD) on zeolite microcrystals in order to gain information on internal density distribution and to learn more about the strain developed during the synthesis and attachment process on the substrate. From the distortion and asymmetry of the diffraction pattern on the (020) Bragg peak, the strain field distribution is estimated. We inverted the diffraction patterns from a less strained crystal to obtain the three-dimensional image of the shape and internal strain fields using the error reduction and hybrid input-output phase retrieval algorithms. We also show a few examples of characteristic distortion modes relevant to CXD of zeolites.