Practical Applications of Nonlinear Measurements

被引：4

作者：

Remley, Kate A. ^{[1
]}

机构：

[1] NIST, Electromagnet Div, Boulder, CO 80305 USA

来源：

2009 73RD ARFTG MICROWAVE MEASUREMENT CONFERENCE | 2009年

关键词：

Linear measurements; Measurement-based model; Nonlinear measurements; Nonlinear vector network analyzer; Vector network analyzer; NETWORK ANALYZER; PHASE;

D O I：

10.1109/ARFTG.2009.5278060

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.

引用

页码：1 / 15

页数：15

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