Deep-ultraviolet quantum interference metrology with ultrashort laser pulses

被引:130
|
作者
Witte, S [1 ]
Zinkstok, RT [1 ]
Ubachs, W [1 ]
Hogervorst, W [1 ]
Eikema, KSE [1 ]
机构
[1] Vrije Univ Amsterdam, Ctr Laser, NL-1081 HV Amsterdam, Netherlands
关键词
D O I
10.1126/science.1106612
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Precision spectroscopy at ultraviolet and shorter wavelengths has been hindered by the poor access of narrow-band lasers to that spectral region. We demonstrate high-accuracy quantum interference metrology on atomic transitions with the use of an amplified train of phase-controlled pulses from a femtosecond frequency comb laser. The peak power of these pulses allows for efficient harmonic upconversion, paving the way for extension of frequency comb metrology in atoms and ions to the extreme ultraviolet and soft x-ray spectral regions. A proof-of-principle experiment was performed on a deep-ultraviolet (2 x 212.55 nanometers) two-photon transition in krypton; relative to measurement with single nanosecond laser pulses, the accuracy of the absolute transition frequency and isotope shifts was improved by more than an order of magnitude.
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页码:400 / 403
页数:4
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