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Registration of USG 3209/Jaypee Wheat Recombinant Inbred Line Mapping Population
被引:3
|作者:
Hall, M. D.
[1
]
Tucker, D.
[1
]
Griffey, C. A.
[1
]
Liu, S.
[1
]
Sneller, C.
[2
]
Guttieri, M.
[2
]
Van Sanford, D.
[3
]
Costa, J.
[4
]
Marshall, D.
[5
]
Brown-Guedira, G. L.
[5
]
机构:
[1] Virginia Polytech Inst & State Univ, Dept Crop & Soil Environm Sci, Blacksburg, VA 24061 USA
[2] Ohio State Univ, Dep Hort & Crop Sci, Wooster, OH 44691 USA
[3] Univ Kentucky, Dept Plant & Soil Sci, Lexington, KY 40546 USA
[4] Univ Maryland, Dep Plant Sci & Landscape Architecture, College Pk, MD 20742 USA
[5] USDA ARS, Plant Sci Res Unit, Raleigh, NC 27695 USA
关键词:
ADULT-PLANT RESISTANCE;
POWDERY MILDEW;
MAP;
D O I:
10.3198/jpr2009.09.0490crmp
中图分类号:
S3 [农学(农艺学)];
学科分类号:
0901 ;
摘要:
'USG 3209'/'Jaypee' (Reg No MP-3, NSL 465777 MAP), is a soft red winter wheat (Triticum aestivum L) recombinant inbred line (RIL) population developed by Virginia Polytechnic Institute and State University and submitted to the USDA-ARS National Small Grains Germplasm Research Facility in Aberdeen, ID, in 2008 This mapping population is composed of 130 F(11) (12) RILs and has been used to study the genetics of adult plant resistance to powdery mildew [Blumeria graminis (DC) E O Speer] and leaf rust (Puccinia triticina Eriks), and soft winter wheat milling and baking quality Genetic linkage maps of this population were created to identify quantitative trait loci governing these traits The genetic marker data collected on this population has been submitted to the GrainGenes database (http//wheat.pw.usda.gov) and includes data from both microsatellite and Diversity Array Technology markers
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页码:159 / 162
页数:4
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