Magnetic force microscopy study of domain walls on a thin cobalt film

被引:25
|
作者
Lin, HN [1 ]
Chiou, YH
Chen, BM
Shieh, HPD
Chang, CR
机构
[1] Natl Sci Council, Precis Instrument Dev Ctr, Hsinchu, Taiwan
[2] Natl Chiao Tung Univ, Inst Electrophys, Hsinchu, Taiwan
[3] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu, Taiwan
[4] Natl Taiwan Univ, Dept Phys, Taipei, Taiwan
关键词
D O I
10.1063/1.367306
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two types of 180 degrees domain walls on a 115 nm cobalt film are observed by magnetic force microscopy. The surface Neel wall on top of an asymmetric Bloch wall is found inhomogeneous. with the width estimated to be around 200 nm. The width of the rhomb-structured cross-tie wall, on the other hand, is approximately 400 nm. The coexistence of these two types of domain walls indicates that their wall energies are comparable at the film thickness. (C) 1998 American institute of Physics.
引用
收藏
页码:4997 / 4999
页数:3
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