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- [1] ENERGY MANAGERS - DO YOU STILL BELIEVE IN THEMPROCESS ENGINEERING, 1979, (MAR) : 56 - 57KLARENBERG, A
Do you believe that atoms stay in place when you observe them in HREM?
被引：25
|作者：
Van Dyck, Dirk
[1
]
Lobato, Ivan
[1
]
Chen, Fu-Rong
[2
]
Kisielowski, Christian
[3
,4
]
机构：
[1] Univ Antwerp, EMAT, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
[2] Natl Tsing Hua Univ, Dept Engn & Syst Sci, Hsinchu 300, Taiwan
[3] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
[4] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USA
来源：
关键词：
Quantitative HREM;
TDS;
Dose rate dependence;
ELECTRON-MICROSCOPE IMAGES;
THERMAL DIFFUSE-SCATTERING;
HIGH-RESOLUTION IMAGES;
PHONON-SCATTERING;
INELASTIC-SCATTERING;
CONTRAST;
DIFFRACTION;
SIMULATIONS;
SENSITIVITY;
HOLOGRAPHY;
D O I：
10.1016/j.micron.2014.09.003
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Recent advancements in aberration-corrected electron microscopy allow for an evaluation of unexpectedly large atom displacements beyond a resolution limit of similar to 0.5 angstrom, which are found to be dose-rate dependent in high resolution images. In this paper we outline a consistent description of the electron scattering process, which explains these unexpected phenomena. Our approach links thermal diffuse scattering to electron beam-induced object excitation and relaxation processes, which strongly contribute to the image formation process. The effect can provide an explanation for the well-known contrast mismatch ("Stobbs factor") between image calculations and experiments. (C) 2014 Elsevier Ltd. All rights reserved.
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页码：158 / 163
页数：6
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