Optical properties of phase-change optical disks with SbxSe100-x films

被引：25

作者：

Babeva, T ^{[1
]}

Dimitrov, D ^{[1
]}

Kitova, S ^{[1
]}

Konstantinov, I ^{[1
]}

机构：

[1] Bulgarian Acad Sci, Cent Lab Photoproc, BU-1113 Sofia, Bulgaria

来源：

VACUUM | 2000年 / 58卷 / 2-3期

关键词：

phase-change optical disk; SbxSe100-x; thin films; multi-layer stack; optical characteristics;

D O I：

10.1016/S0042-207X(00)00211-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Complex refractive indices of thermally evaporated SbxSe100-x thin films, both amorphous (as deposited) and crystallized after thermal treatment are determined in the spectral range 400-1000 nm. The results are used to simulate the optical characteristics (reflection, absorption and phase difference) of multilayer stack configurations including two protective dielectric layers, a reflective layer and SbxSe100-x thin films as a phase-change recording layer. Optimal multilayer stack configurations as a function of the recording layer composition are determined. The applicability of SbxSe100-x thin films as recording materials for CD-RW and DVD-RW optical disks at lambda = 640 and 780 nm is discussed. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：496 / 501

页数：6

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