Sync devices noise-immunity analysis theoretical basis

被引：0
|
作者：
Bondarev, A [1 ]
机构：
[1] Lviv Polytech Natl Univ, Dept Telecommun, UA-79046 Lvov, Ukraine
来源：
MODERN PROBLEMS OF RADIO ENGINEERING, TELECOMMUNICATIONS AND COMPUTER SCIENCE, PROCEEDINGS | 2004年
关键词：
syncronization; noise-immunity; stochastic process; phase-plane portrait; bifurcation; phase hocked loop;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
An approach to analysis of sync devices noise immunity, which allow to determinate physical border of sync possibility under the influence of noises and to unify the analysis of stochastic and determinate disturbances influence, had been proposed in this paper.
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页码：27 / 34
页数：8
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