Planning accelerated reliability tests for mission-oriented systems subject to degradation and shocks

被引:13
|
作者
Zhao, Xiujie [1 ]
He, Kangzhe [1 ]
Kuo, Way [1 ]
Xie, Min [1 ,2 ]
机构
[1] City Univ Hong Kong, Dept Syst Engn & Engn Management, Kowloon, Hong Kong, Peoples R China
[2] City Univ Hong Kong, Shenzhen Res Inst, Shenzhen, Peoples R China
基金
中国国家自然科学基金;
关键词
Continuous degradation; design of experiments; mission reliability; reliability prediction; Wiener process; COMPETING FAILURE PROCESSES; OPTIMAL-DESIGN; LIFE TESTS; OPTIMIZATION; WEIBULL; MODEL;
D O I
10.1080/24725854.2019.1567958
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article presents a novel accelerated reliability testing framework for mission-oriented systems. The system to be tested is assumed to suffer from cumulative degradation and traumatic shocks with increasing intensity. We propose a new optimality criterion that minimizes the asymptotic variance of the predicted reliability evaluated at the mission?s end time. Two usage scenarios are considered in this study: one is to assume that systems are brand new at the start of the mission and the other is that systems are randomly selected from used ones under pre-determined policies. Optimal test plans for both scenarios are obtained via delta methods by utilizing the Fisher information. The global optimality of test plans is verified using general equivalence theorems. A revisited example of a carbon-film resistor is presented to illustrate the efficiency and robustness of optimal test plans for both new and randomly aged systems. The result shows that the test plan tends to explore more on lower stress levels for randomly aged systems. Furthermore, we conduct simulation studies and explore compromise test plans for the example.
引用
收藏
页码:91 / 103
页数:13
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