EGRET observations in X-ray binaries

被引：0

作者：

Jones, BB ^{[1
]}

Lin, YC ^{[1
]}

Michelson, PF ^{[1
]}

Nolan, PL ^{[1
]}

Roberts, MSE ^{[1
]}

Tompkins, WF ^{[1
]}

机构：

[1] Stanford Univ, Stanford, CA 94305 USA

来源：

PROCEEDINGS OF THE FOURTH COMPTON SYMPOSIUM, PTS 1 AND 2: PT 1: THE COMPTON OBSERVATORY IN REVIEW; PT 2: PAPERS AND PRESENTATIONS | 1997年 / 410期

关键词：

D O I：

暂无

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

Several known low-and high-mass X-ray binaries with orbital periods between tens of minutes and several days were examined in EGRET data. Instrument thresholds for orbital modulation were calculated, and appropriate observations were analyzed with new software which uses maximum likelihood methods for signal detection, fully accounting for variations in EGRET exposure, as well as the structured gamma ray background and the. energy-dependent point-spread function. While some sources were not detected by EGRET at all, several were marginally detected with less than 5 sigma significance. However, due to significant background and low statistics, the observations were unable to constrain the modulation fraction of any of the sources.

引用

页码：783 / 787

页数：5

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