Do Failures Make Clever? - The Extended VDI-Guideline 3822 "Failure Analysis"

被引：0
|
作者：
Pohl, Michael
机构：
来源：
MATERIALS TESTING-MATERIALS AND COMPONENTS TECHNOLOGY AND APPLICATION | 2010年 / 52卷 / 06期
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暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Do Failures Make Clever? - The Extended VDI-Guideline 3822 "Failure Analysis" Generally, failures make more poor than clever. Only the systematic analysis of technological failure cases makes the original mechanisms visible which lead to the keys for failure future avoidance. The present contribution highlights the current state of the VDI-Guideline 3822 "Failure Analysis" which is also available in English language.
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页码：354 / 355
页数：2
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