Molecular beam epitaxy and characterization of InGaAs/AlAs/AlAsSb coupled double quantum wells with extremely thin coupling barriers

被引:4
|
作者
Mozume, T. [1 ]
Gozu, S. [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
来源
关键词
aluminium compounds; energy gap; gallium arsenide; III-V semiconductors; indium compounds; molecular beam epitaxial growth; monolayers; photoreflectance; semiconductor growth; semiconductor quantum wells; transmission electron microscopy; X-ray diffraction; INTERSUBBAND ABSORPTION; CASCADE LASERS;
D O I
10.1116/1.3280950
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
InGaAs/AlAs/AlAsSb coupled double quantum wells (CDQWs) with extremely thin AlAs coupling barriers between InGaAs wells were gown by molecular beam epitaxy. The structural quality was examined by the high-resolution x-ray diffraction and the high-energy transmission electron microscopy. It is confirmed that the CDQWs with the 2 monolayer (ML) AlAs coupling barrier was successfully grown. Clear and sharp peaks corresponding to interband transitions were observed in the photoreflectance spectra of CDQWs with 2 and 3 ML of AlAs coupling barrier. The calculated transition energies correspond well with the measured energies. By reducing the AlAs coupling barrier thickness from 3 to 2 ML, the interband transition energy was redshifted toward the communication wavelength of 1.55 mu m as expected. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3280950]
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页数:4
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