Open architecture test system: System architecture and design

被引：0
|
作者：
Rajsuman, R [1 ]
Noriyuki, M [1 ]
机构：
[1] Advantest Amer Corp, Santa Clara, CA 95054 USA
来源：
INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS | 2004年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The Open Architecture Test System provides a method and framework under which software and instruments of different vendors can be developed and integrated into an ATE. In this paper, we describe the overall architecture and design of the system. First we describe the architecture and the control mechanism for the overall system and for individual test-sites. Data and command communication mechanism among these control elements is explained. After this general structure, we describe how this architecture allows deployment of third party instruments and modules, what are the interfaces, how system is configured and how correct operation of the system is ensured after plugging-in a third party module.
引用
收藏
页码：403 / 412
页数：10
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