Evolution of dielectric permittivity under applied field in PLZT 8.3/70/30 ceramics

被引：2
|
作者：
Birks, E [1 ]
Kundzinsh, M [1 ]
Sternberg, A [1 ]
机构：
[1] Univ Latvia, Inst Solid State Phys, LV-1063 Riga, Latvia
来源：
FERROELECTRICS | 2000年 / 240卷 / 1-4期
关键词：
diffused phase transition; dielectric permittivity; evolution in time;
D O I：
10.1080/00150190008227971
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The jump of dielectric permittivity as function of bias field applied after various duration of storage at the measurement temperature is investigated. The influence of storage time on epsilon(E=) depends on the value of bias field and frequency of measuring field. It is found that epsilon(E=) depends on the path of how particular field value is reached.
引用
收藏
页码：1465 / 1471
页数：7
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