Statistical theory to holographic and speckle metrology

In this paper, the basic view points and methods of statistical metrological theory to holographic and speckle metrology are reviewed As an example, the statistical theory is applied to quasi-heterodyne holographic interferometry. The results reveal the relation between fringe distribution and system parameters and the relation between measuring accuracy and system errors. From this example, it can be found that statistical metrological theory is superior that the conventional geometrical theory.