Orthogonal fluxgate of low noise by electrodeposited multilayers amorphous wires

被引：2
|
作者：
Garcia, A.
Moron, C.
Tremps, E.
Maganto, F. J.
Enriquez, J. L.
机构：
[1] UPM, Dept SIA, EU Informat, Madrid 28031, Spain
[2] UPM, Dept Tecn Edificac, EUA Tecn, Madrid 28040, Spain
[3] UPM, Dept Tecnol Mat, ETSI Minas, Madrid 8040, Spain
来源：
SENSOR LETTERS | 2007年 / 5卷 / 01期
关键词：
fluxgate; electrodeposition; amorphous; wires;
D O I：
10.1166/sl.2007.074
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
The viability of new kind of cores for orthogonal gated flux-gates has been studied. The cores made of copper wires covered with amorphous multilayers of CoP obtained electrolytically have been tested using two different methods: detection of the 2nd harmonic of the exciting frequency and by using an anhysteretic method. Results show good response but an hysteresis effect can be appreciated for low magnetic field.
引用
收藏
页码：212 / 214
页数：3
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