X-ray reflectivity and diffuse scattering

被引：3
|
作者：
Gibaud, A [1 ]
Hazra, S [1 ]
机构：
[1] Univ Maine, Fac Sci, UPRES A 6087, F-72085 Le Mans 9, France
来源：
CURRENT SCIENCE | 2000年 / 78卷 / 12期
关键词：
D O I：
暂无
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
X-ray specular reflectivity and diffuse scattering techniques are presented and illustrated with experimental results obtained on different kinds of thin films and surfaces. After a short introduction on the Fresnel reflectivity, the matrix technique is developed; the kinematical Born approximation is then deduced from the dynamical theory. In this approximation it is shown how the diffuse scattering contribution can be analysed.
引用
收藏
页码：1467 / 1477
页数：11
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