High placement and levelling accuracy flip-chip assembly for MOEMS

被引:0
|
作者
Quirke, C
Lecarpentier, G
机构
关键词
D O I
10.1117/12.469670
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
MOEMS micromirror device technology is becoming more important in the effort to develop cost-effective nxn optical switches for next-generation fiber optic networks. Although there are a variety of fabrication and assembly methods available, most are complex and costly. Using established flip-chip assembly techniques to perform device transfer can greatly simplify the assembly process. For this project, a high-accuracy device bonder is proposed for transfer of optical micromirror devices from one substrate to another. The same technique can be applied to individual devices. or on the wafer level. A high-accuracy device bonder is used for, placement and in-situ bonding. The device bonder is capable of achieving 1 mum post-bonding accuracy in x, y and z axes. Levelling accuracy on the order of microns for a 200mm wafer ensures that the optical paths are correctly aligned. In-situ bonding also ensures that the levelling accuracy is maintained for the final device. Prior methods which use the self-levelling effect of solder bumps in a mass reflow type of operation can result in an unacceptable shift in the parallelism, ruining the device's optical performance. Using a high-accuracy device bonder, devices can be successfully transferred using a flip-chip method. The x, y and z placement is accurate to within 1 mum, and even less in some cases. The 1 mum accuracy is sufficient to ensure that optical paths align to waveguides which are subsequently used to align to a 9mum singlemode fiber core. This method of MOEMS transfer reduces the complexity of the transfer process. Use of existing flip-chip placement and bonding techniques speeds the development cycle of MOEMS devices. The flip-chip assembly method is a cost effective and simple method for transfer of MOEMS devices. This method is enabled by a high-accuracy device bonder which is used for 1 mum accuracy placement and in-situ bonding.
引用
收藏
页码:76 / 81
页数:6
相关论文
共 50 条
  • [1] High accuracy flip-chip assembly of MOEMS
    Quirke, C
    Lecarpentier, G
    PROCEEDINGS OF THE 4TH INTERNATIONAL SYMPOSIUM ON ELECTRONIC MATERIALS AND PACKAGING, 2002, : 226 - 230
  • [2] FLIP-CHIP ASSEMBLY
    HUGLE, WB
    BAMBERG, JL
    PEDROTTI, DG
    SOLID STATE TECHNOLOGY, 1969, 12 (08) : 62 - &
  • [3] Processing mechanics for flip-chip assembly
    Wang, JJ
    Qian, ZF
    Liu, S
    MICROELECTRONIC PACKAGING AND LASER PROCESSING, 1997, 3184 : 22 - 29
  • [4] Flip-chip assembly for photonic circuits
    Wörhoff, K
    Heideman, RG
    Gilde, MJ
    Blidegn, K
    Heschel, M
    van den Vlekkert, H
    MICRO-OPTICS: FABRICATION, PACKAGING, AND INTEGRATION, 2004, 5454 : 9 - 20
  • [5] Double bump flip-chip assembly
    Yan, Kathy Wei
    Johnson, R. Wayne
    Stapleton, Russell
    Ghosh, Kalyan
    IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2006, 29 (02): : 119 - 133
  • [6] Stud bump flip chip assembly of MEMS and MOEMS
    Riley, GA
    2001 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 2001, 4587 : 662 - 665
  • [7] Gallium based interconnects for flip-chip assembly
    Stanfield, AA
    Mannan, SH
    2ND 1998 IEMT/IMC SYMPOSIUM, 1998, : 347 - 352
  • [8] Microspring Characterization and Flip-Chip Assembly Reliability
    Cheng, Bowen
    De Bruyker, Dirk
    Chua, Chris
    Sahasrabuddhe, Kunal
    Shubin, Ivan
    Cunningham, John E.
    Luo, Ying
    Boehringer, Karl F.
    Krishnamoorthy, Ashok V.
    Chow, Eugene M.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2013, 3 (02): : 187 - 196
  • [9] Flip-chip on organic carrier assembly evaluation
    Banks, DR
    Bahe, SM
    Holcomb, MD
    Le-Huu, DK
    PAN PACIFIC MICROELECTRONICS SYMPOSIUM, 2001, PROCEEDINGS, 2001, : 230 - 234
  • [10] Indium bumps investigation for the flip-chip assembly
    Biktashov, Aidar M.
    Kuzmin, Nikolai B.
    Paulish, Andrei G.
    EDM 2006: 7TH ANNUAL INTERNATIONAL WORKSHOP AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, PROCEEDINGS, 2006, : 35 - +