Detection and Matching of Lines for Close-Range Photogrammetry

被引:0
|
作者
Lopez, Juan [1 ]
Fucinos, Maria [1 ]
Fdez-Vidal, Xose R. [1 ]
Pardo, Xose M. [1 ]
机构
[1] Univ Santiago de Compostela, Ctr Invest Tecnoloxias Informac CITIUS, E-15782 Santiago De Compostela, Spain
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中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Photogrammetry is a flexible, accurate and non-contact measurement tool, which has been proven to be very profitable for many industrial applications. In order to achieve robustness and full automation of the measurement process, all commercial photogrammetric systems use physical retro-reflective markers. However, attaching markers to big structures is often impractical. Recently, big interest emerged concerning the use of natural markers, such as lines and conics, in industrial photogrammetric processes. In this paper we present a novel approach for line detection and matching aimed at achieving good performance with industrial images acquired under varying illumination conditions.
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收藏
页码:732 / 739
页数:8
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