Analysis of electrical charge transport, storage and release by metal-insulator-metal structures

被引:0
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作者
Neagu, ER
Neagu, RM
MaratMendes, JN
机构
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D O I
10.1109/ISE.1996.578042
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Isothermal electric measurements on 6 mu m PET samples using step voltage, triangular symmetric voltage of very high period, and constant current as well as nonisothermal and thermally stimulated depolarisation current measurements ha ie been carried out A model is proposed for the electric charge transport. storage and release by M-I-M structures. On the basis of the proposed model one can explain: the ohmic behaviour of NI-I contact, the strong resemblance of polarisation current and space charge current in thermally simulated polarisation and depolarisation current measurements, the coexistence of dipolar charge and self trapped charge In polarised sample, and the bulk limitation of the charge transport process.
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页码:60 / 65
页数:6
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